Inspection is part of the process, not an afterthought. We measure the features that matter to your function — channel depth, flatness, port position, window parallelism — and ship the data with the parts.
A dimensional report that lists everything except the feature your device depends on is noise. We agree the critical characteristics with you at drawing review, then build the measurement plan around them.
Typical values. Tighter limits are available after a drawing review — share the functional requirement rather than a blanket tolerance.
| Parameter | Standard | Precision / achievable | Notes |
|---|---|---|---|
| CMM / vision resolution | 1 µm | — | Temperature-controlled inspection area |
| Channel depth verification | ±10 µm | ±5 µm | White-light interferometry |
| Flatness verification | 2 µm / 50 mm | — | Optical flat or interferometry |
| Report formats | dimensional report, C of C | FAIR / PPAP-style | Agreed at drawing review |
| Sampling | AQL 1.0 default | 100% on critical features | Per agreement |
| Compliance documents | RoHS / REACH declarations | — | Full material traceability |
Every RFQ is reviewed by a process engineer — expect a reply within one business day, with the route we would run and where cost can be removed.